Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density

Tengeri, Dávid; Vidács, László; Beszédes, Árpád; Jász, Judit; Balogh, Gergő; Vancsics, Béla; Gyimóthy, Tibor

doi:10.1109/ICSTW.2016.25

by Dávid Tengeri, László Vidács, Árpád Beszédes, Judit Jász, Gergő Balogh, Béla Vancsics, Tibor Gyimóthy

Reference:

Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density (Dávid Tengeri, László Vidács, Árpád Beszédes, Judit Jász, Gergő Balogh, Béla Vancsics, Tibor Gyimóthy), In Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16), IEEE Computer Society, 2016.

Bibtex Entry:

@inproceedings{Tengeri:Mutation:2016:Mutation, 
author    = {Tengeri, Dávid and Vidács, László and Beszédes, Árpád and Jász, Judit and Balogh, Gergő and Vancsics, Béla and Gyimóthy, Tibor}, 
booktitle = {Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16)},
title     = {Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density}, 
publisher = {IEEE Computer Society},
location  = {Chicago, USA},
year      = {2016}, 
month     = {April}, 
pages     = {174-179}, 
doi       = {10.1109/ICSTW.2016.25}
}